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Validation Framework

Extensive testing of best practice architectures is key to the Juniper Validated Design (JVD) program. JVDs qualify and quantify these best practice architectures, providing customers knowledge about the products and how solution can be deployed.

JVDs employ a layered testing approach to deliver reliability and repeatability. Individual features receive functional testing. Multifunction testing builds on this functional testing to see if multiple features work together. Product delivery testing builds upon multifunctional testing to validate that these features combined perform as expected for tested use cases, and JVD testing builds upon product delivery testing by testing multiple products together (including third-party integrations where appropriate) to ensure that all these products combined make an industry-leading solution.

Figure 1: Validation Framework A diagram of a product testing process Description automatically generated

Testing with real-world applications and traffic provides more accurate data regarding performance and response to different configurations. The standardized nature of JVDs ensures the same network architecture is deployed in multiple testing environments, and the use of JVDs by multiple customers allows for any lessons learned in production deployments to rapidly benefit all JVD customers. The more JVDs that are deployed worldwide, the greater the value they provide to all.

Test Bed

The test bed environment consists of a 5-stage EVPN/VXLAN fabric managed by Juniper Apstra, with three pods —compute, storage and service pod. An external router is also connected to the border leaf switches. A traffic generator (IXIA) is connected to the test ports connected to the leaves in each pod.

A screenshot of a computer Description automatically generated

Platforms / Devices Under Test (DUT)

Table 1: : Devices under Test
Platforms and Roles
Solution Server Leaf Switches Border Leaf Switches Spine Super Spine
5-stage EVPN/VXLAN Datacenter design (ERB) QFX5120-48YM QFX5130-48C (EVO) QFX5220-32CD (EVO) QFX5230-64CD (EVO)
QFX5130-32CD (EVO)   QFX5210-64C  
    QFX5120-32C  
Table 2: 100G Optics used on Devices under Test
Part number Optics Name Device Role Device Model
740-061405 QSFP-100GBASE-SR4 Border Leaf QFX5130-48C
740-061405 QSFP-100GBASE-SR4 Border Leaf QFX5130-32CD
740-058734 QSFP-100GBASE-SR4 Border Leaf QFX5130-48C
740-061405 QSFP-100GBASE-SR4 Compute Leaf QFX5120-48YM-8C
740-061405 QSFP-100GBASE-SR4 Superspine QFX5230-64CD
740-058734 QSFP-100GBASE-SR4 Superspine QFX5230-64CD
740-061405 QSFP-100GBASE-SR4 Spine QFX5120-32C
740-061405 QSFP-100GBASE-SR4 Spine QFX5220-32CD
740-061405 QSFP-100GBASE-SR4 Spine QFX5210-64C
Table 3: 10G Optics used on Devices under Test
Part number Optics Name Device Role Device Model
740-030658 SFP+-10G-USR Border Leaf QFX5130-48C
740-021308 SFP+-10G-SR Border Leaf QFX5130-48C
740-031980 SFP+-10G-SR Border Leaf QFX5130-48C
740-021308 SFP+-10G-SR Compute Leaf QFX5120-48YM-8C
740-031980 SFP+-10G-SR Compute Leaf QFX5120-48YM-8C
740-067442 QSFP+ 40GBase-SR4 Compute Leaf QFX5120-48YM-8C
740-067442 QSFP+ 40GBase-SR4 Storage Leaf QFX5130-32CD
740-067443 QSFP+-40G-SR4 Storage Leaf QFX5130-32CD

Test Bed Configuration

Contact your Juniper representative to obtain the full archive of the test bed configuration used for this JVD.