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Validation Framework

Extensive testing of best practice architectures is key to the Juniper Validated Design (JVD) program. JVDs qualify and quantify these best practice architectures, providing customers knowledge about the products and how solution can be deployed.

JVDE document is an extension of the core JVD document. Like the Juniper Validated Design document, JVDEs employ a layered testing approach to deliver reliability and repeatability. Individual features receive functional testing. Multifunction testing builds on this functional testing to see if multiple features work together. Product delivery testing builds upon multifunctional testing to validate that these features combined perform as expected for tested use cases, and JVD testing builds upon product delivery testing by testing multiple products together (including third-party integrations where appropriate) to ensure that all these products combined make an industry-leading solution.

Figure 1: Validation Framework A diagram of a product testing process Description automatically generated

Testing with real-world applications and traffic provides more accurate data regarding performance and response to different configurations. The standardized nature of JVDs ensures the same network architecture is deployed in multiple testing environments, and the use of JVDs by multiple customers allows for any lessons learned in production deployments to rapidly benefit all JVD customers. The more JVDs that are deployed worldwide, the greater the value they provide to all.

Test Bed

The test bed environment consists of two 3-stage fabric data center, 1 collapsed fabric and a 5-stage fabric data centers so as to covers different data center interconnect designs and hardware for border leaves.

Over the top (OTT) Test Bed

The test bed design uses two 3-stage Fabric pre-configured in Apstra as Blueprints. The two data centers were used to interconnect the two fabric using DCI feature in Apstra. In DC1, two QFX5700 are the border leaf switches and in DC2 two PTX10001-36MR were used as border leaf switches. The two DCs were connected using Interconnect switches, for the purposes of this lab QFX10002-36Q were used. A traffic generator (IXIA) is connected to the test ports connected to the leaves.

Figure 2: OTT Test Topology A diagram of a network AI-generated content may be incorrect.

EVPN-VXLAN Type 2 Seamless stitching (with MACSEC)

For the purposes of this lab design, a 3-stage and a collapsed fabric design were pre-configured in Apstra as blueprints. The two data centers were used to interconnect the two fabric using DCI feature in Apstra. In DC1, two QFX5700 are the border leaf switches and in DC3 two QFX5120-48YM were used as collapsed leaf switches. The two DCs were connected using Interconnect switches, for the purposes of this lab QFX10002-36Q were used. A traffic generator (IXIA) is connected to the test ports connected to the leaves in each pod.

Figure 3: EVPN VXLAN Type 2 Seamless stitching A diagram of a computer network AI-generated content may be incorrect.

EVPN-VXLAN Type 2 and Type 5 Seamless stitching

For the purposes of this lab design, a 3-stage and a 5-stage fabric design were pre-configured in Apstra as blueprints. The two data centers were used to interconnect the two fabric using DCI feature in Apstra. In DC1, two QFX5700 are the border leaf switches and in DC4 two QFX5130-48C were used as border leaf switches. The two DCs were connected using Interconnect switches, for the purposes of this lab QFX10002-36Q were used. A traffic generator (IXIA) is connected to the test ports connected to the leaves in each pod.

Figure 4: EVPN VXLAN Type 2 and Type 5 Seamless Stitching A computer screen shot of a computer network AI-generated content may be incorrect.
Table 1: : VLAN Grouping for the Test Bed
VLAN GROUP VLAN Ranges Subnet IPv4 Subnet IPv6 Description
RED_COMMON 400-599 10.0.[0-199].0/24 2001:db8:dc1:10:0:[0-c7]::/9 Common range to hosts in both DC sites, linked to RED V
RED_SUB_DC1 600-799 10.1.[0-199].0/24 2001:db8:dc1:10:1:[0-c7]::/9 Unique VLAN ranges in DC1, linked to RED VRF
RED_SUB_DC2 800-999 10.2.[0-199].0/24 2001:db8:dc1:10:2:[0-c7]::/9 Unique VLAN ranges in DC2, linked to RED VRF
RED_SUB_DC4 1200-1399 10.4.[0-199].0/24 2001:db8:dc1:10:4:[0-c7]::/9 Unique VLAN ranges in DC4, linked to RED VRF
BLUE_COMMON 1400-1599 10.10.[0-199]/024 2001:db8:dc1:10:a:[0-c7]::/9 Common range to hosts in both DC sites, linked to BLUE
BLUE_SUB_DC1 1600-1799 10.11.[0-199]/024 2001:db8:dc1:10:b:[0-c7]::/9 Unique VLAN ranges in DC1, linked to BLUE VRF
BLUE_SUB_DC2 1800-1999 10.12.[0-199]/024 2001:db8:dc1:10:c:[0-c7]::/9 Unique VLAN ranges in DC2, linked to BLUE VRF
BLUE_SUB_DC4 2200-2399 10.14.[0-199]/024 2001:db8:dc1:10:e:[0-c7]::/9 Unique VLAN ranges in DC4, linked to BLUE VRF
GREEEN_SUB_DC1 2700-2899 10.27.0.0/24 2001:db8:dc1:10:1b:[0-c7]::/ Unique VLAN ranges per site, linked to GREEN (Type 5 ON
GREEEN_SUB_DC4 2500-2699 10.25.0.0/24 2001:db8:dc1:10:19:[0-c7]::/ Unique VLAN ranges per site, linked to GREEN (Type 5 ON

All of the above test beds were mutually exclusive and were configured separately to test the three DCI designs. VLAN and Subnets above in Table 1 were used to configure the testports using IXIA.

Platforms / Devices Under Test (DUT)

Table 2: : Devices Under Test
Platforms and Roles
Solution Server Leaf Switches Border Leaf Switches Spine Super Spine
3-stage EVPN/VXLAN Data Center design (ERB) QFX5120-48Y-8C QFX5700 (EVO) QFX5220-32CD (EVO)  
QFX5110-48S PTX10001-36MR QFX5120-32C  
Collapsed Fabric Data Center design QFX5120-48YM      
5-stage EVPN/VXLAN Data Center design (ERB) QFX5120-48YM QFX5130-48C (EVO) QFX5220-32CD (EVO) QFX5230-64CD (EVO)
QFX5130-32CD (EVO)   QFX5210-64C  
    QFX5120-32C  
Table 3: : Optics Used for DCI - OTT
Part number Optics Name Device Role Device Model
740-067442 QSFP+ 40GBase-SR4 Border Leaf QFX5700
740-067443 QSFP+-40G-SR4 Border Leaf QFX5700
740-054053 QSFP+-4X10G-SR Border Leaf PTX10001-36MR
Table 4: : Optics Used for DCI – Type 2 Seamless Stitching
Part number Optics Name Device Role Device Model
740-067442 QSFP+ 40GBase-SR4 Border Leaf QFX5700
740-067443 QSFP+-40G-SR4 Border Leaf QFX5700
740-031980 SFP+-10G-SR Collapsed Fabric Leaf QFX5120-48YM
Table 5: : Optics Used for DCI – Type 2 and Type 5 Seamless Stitching
Part number Optics Name Device Role Device Model
740-067442 QSFP+ 40GBase-SR4 Border Leaf QFX5700
740-067443 QSFP+-40G-SR4 Border Leaf QFX5700
740-030658 SFP+-10G-USR Border Leaf QFX5130-48C
740-021308 SFP+-10G-SR Border Leaf QFX5130-48C

Test Bed Configuration

Contact your Juniper representative to obtain the full archive of the test bed configuration used for this JVD.