Troubleshooting RPM Information
Problem
Description: You can view the RPM configuration to verify the following information:
- The RPM configuration is within the expected values.
- The RPM probes are functioning and the RPM statistics are within expected values.
- The device is configured to receive and transmit TCP and UDP RPM probes on the correct ports.
In addition to the RPM statistics for each RPM test, the J-Web interface displays the round-trip times and cumulative jitter graphically. In the graphs, the round-trip time and jitter values are plotted as a function of the system time. Large spikes in round-trip time or jitter indicate a slower outbound (egress) or inbound (ingress) time for the probe sent at that particular time.
Solution
To view RPM information:
- Select Troubleshoot>RPM>View RPM in the J-Web user interface.
- Enter the information specified in Table 270 to troubleshoot the issue.
Table 270: RPM Information Troubleshooting Options
| Field | Function | Additional Information |
|---|---|---|
| Currently Running Tests | ||
Graph | Click the Graph link to display the graph (if it is not already displayed) or to update the graph for a particular test. | |
Owner | Configured owner name of the RPM test. | — |
Test Name | Configured name of the RPM test. | — |
Probe Type | Type of RPM probe configured for the specified test. Following are valid probe types:
| — |
Target Address | IP address or URL of the remote server that is being probed by the RPM test. | — |
Source Address | Explicitly configured source address that is included in the probe packet headers. | If no source address is configured, the RPM probe packets use the outgoing interface as the source address, and the Source Address field is empty. |
Minimum RTT | Shortest round-trip time from the J Series device to the remote server, as measured over the course of the test. | — |
Maximum RTT | Longest round-trip time from the J Series device to the remote server, as measured over the course of the test. | — |
Average RTT | Average round-trip time from the J Series device to the remote server, as measured over the course of the test. | — |
Standard Deviation RTT | Standard deviation of round-trip times from the J Series device to the remote server, as measured over the course of the test. | — |
Probes Sent | Total number of probes sent over the course of the test. | — |
Loss Percentage | Percentage of probes sent for which a response was not received. | — |
| Round-Trip Time for a Probe | ||
Samples | Total number of probes used for the data set. | The J Series device maintains records of the most recent 50 probes for each configured test. These 50 probes are used to generate RPM statistics for a particular test. |
Earliest Sample | System time when the first probe in the sample was received. | — |
Latest Sample | System time when the last probe in the sample was received. | — |
Mean Value | Average round-trip time for the 50-probe sample. | — |
Standard Deviation | Standard deviation of the round-trip times for the 50-probe sample. | — |
Lowest Value | Shortest round-trip time from the device to the remote server, as measured over the 50-probe sample. | — |
Time of Lowest Sample | System time when the lowest value in the 50-probe sample was received. | — |
Highest Value | Longest round-trip time from the J Series device to the remote server, as measured over the 50-probe sample. | — |
Time of Highest Sample | System time when the highest value in the 50-probe sample was received. | — |
| Cumulative Jitter for a Probe | ||
Samples | Total number of probes used for the data set. | The J Series device maintains records of the most recent 50 probes for each configured test. These 50 probes are used to generate RPM statistics for a particular test. |
Earliest Sample | System time when the first probe in the sample was received. | — |
Latest Sample | System time when the last probe in the sample was received. | — |
Mean Value | Average jitter for the 50-probe sample. | — |
Standard Deviation | Standard deviation of the jitter values for the 50-probe sample. | — |
Lowest Value | Smallest jitter value, as measured over the 50-probe sample. | — |
Time of Lowest Sample | System time when the lowest value in the 50-probe sample was received. | — |
Highest Value | Highest jitter value, as measured over the 50-probe sample. | — |
Time of Highest Sample | System time when the highest jitter value in the 50-probe sample was received. | — |